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In line characterization and study of spatial deformity generated by stress during MEMS fabrication yielding to their damage

Offer N°: 2627

Start date: 1 Dec 2010

Performances and fabrication improvements of MEMS yield to an increase of their miniaturization. While their dimension shrink the stress and deformation to which they are submitted become more and more important. So there is a real need to characterize and monitor Microsystems deformations and link them to their performances and integrity at fabrication time.



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  • Chemistry for nanos
  • Imaging devices & Systems
  • Materials
  • Memory technologies
  • MEMS and sensors
  • Microtechnologies for bio
  • Molecular electronics
  • Nanocharacterization
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  • Nanos for Energy
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    Theme:

  • Chemistry for nanos
  • Imaging devices & Systems
  • Materials
  • Memory technologies
  • MEMS and sensors
  • Microtechnologies for bio
  • Molecular electronics
  • Nanocharacterization
  • Nanoelectronics
  • Nanos for Energy
  • Nanoscale simulation
  • Other
  • Photonics
  • Process Technologies
  • RF Devices & Systems
  • Spintronics
  • Laboratory:


    Your search

    Theme:

  • Chemistry for nanos
  • Imaging devices & Systems
  • Materials
  • Memory technologies
  • MEMS and sensors
  • Microtechnologies for bio
  • Molecular electronics
  • Nanocharacterization
  • Nanoelectronics
  • Nanos for Energy
  • Nanoscale simulation
  • Other
  • Photonics
  • Process Technologies
  • RF Devices & Systems
  • Spintronics
  • Laboratory:


    Your search

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